设备介绍 一裂片后的OLEDCell,在还没BondDriverIC之前,将所有正极短路,所有负极亦短路(以PM型为例),而后在该二端点上加上正及负的电压做测试该交流测试电压的大小,频率,及周波数皆为Programmable(可在主控PC上设定),在一次的交流测试后,紧接着为量测段,使用者先设定反偏电压,HA570会对每一片面板量测其反偏逆电流并记录,解析精度至10nA.无论顺向或逆向,HA570均提供限流保护,可使某些先期不稳定的产品不至于断电而有可能在持续的交流测试中复元.OLEDCell是置于治具 电木Tray盘上,一个Tray可置放30pcCells,一炉共可容纳:24Trayx30Cell=720Cell/炉. AgingProcessItemParameter RemarkTotalcycleProgrammable1~100 Tt1~250min.,1min.stepFwdVoltageTm60sec.MeasurementcycletimeVft0~+20V,0.1VstepSetforeachcycle/eachtrayVrt0~-20V,0.1VstepSetforeachcycle/eachtrayVrm0~-20V,0.1VstepReversevoltageofTm,Setforeachcyclef1~100Hz,1Hzstep1/T,FrequencyofTtDutycycle5%~100%,1%stepTf/T,risingtime/fallingtime 10uSIf200mAmax.Outputcurrent MeasurementItemParameter RemarkIF0.1mA~200mA,0.1mAstepFwdcurrentIrAccuracy:1.10nA~1uA:10nA2.1uA~100uA:5%Static-stateLeakageCurrent CurrentLimitItemParameterRemarkIfcurrentlimit200mASetforeachcellIRcurrentlimit200mASetforeachcell