供应光束质量分析仪

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【供应光束质量分析仪】详细说明

狭缝扫描式光束质量分析仪

特性高精度分析光束质量和空间功率分布单个独立的测量头用于连续或脉冲激光束扫描速度可变集成功率计（未校准）高动态范围低噪声放大器2D或伪3D图形快速USB2.0连接PC软件的特性

Item #	BP10x-UV	BP10x-VIS	BP10x-IR	BP10x-IR2
Wavelength Range (nm)	200 - 1100	400 - 1100	700 - 1800	1000 - 2700
Detector Type	Si - UV Enhanced	Si	Ge	Extended InGaAs
Aperture Diameter	4 mm (BP104-xx), 9 mm (BP109-xx)
Slit Size	2.5 m (BP104-xx), 5 m (BP109-xx)
Min Beam Diameter	10 m (BP104-xx), 20 m (BP109-xx)

带易于调节的子窗口的多功能图形界面可调节位置的X和Y轴截面轮廓带椭圆光束拟合的2D功率密度图形，灵活的3D图形总光束功率随时间的曲线分析中心位置的漂移

图形和文本文件输出可按序列保存（新）通过/失败分析自动M 光束质量测量模块更高精度的热噪点和背景光校正（新）可设置的颜色配置（新）

Item #	BP104-UV	BP104-VIS	BP104-IR	BP104-IR2	BP109-UV	BP109-VIS	BP109-IR	BP109-IR2
Sensor
Wavelength Range (nm)	200 - 1100	400 - 1100	700 - 1800	1000 - 2700	200 - 1100	400 - 1100	700 - 1800	1000 - 2700
Detector Type	Si - UV Enhanced	Si	Ge	Extended InGaAs	Si - UV Enhanced	Si	Ge	Extended InGaAs
Aperture Diameter	4 mm				9 mm
Scan Method	Scanning Slits
Slit Size	2.5 m				5 m
Min Beam Diameter	10 m				20 m
Max Beam Diameter	4 mm				9 mm*
Scan Rate	1.0 - 20.0 per s (continuously variable)
Sampling Resolution	0.5 - 38 m (depending on scan rate)				1.1 - 38 m (depending on scan rate)
Power Range	10 nW - 10 W (depending on beam diameter and model)
Amplifier Bandwidth	10 to 150 kHz in 10 kHz Steps (@ -1 dB)
Sample Frequency	0.0625 - 1.0 MHz
Dynamic Range	72 dB (Amplifier Switchable)
Signal Digitization	16 bit
Head Size	80 mm x 60 mm (including rotation mount)
Minimum Pulse Rate	10 Hz (300 kHz if using the M Option)
Software
Displayed Parameters/Features	X-Y-Profile, Centroid Position, Peak Position, Pseudo 3D Profile, Beam Width Clip Level/Second Moment (4 ), Gaussian Fit Applicable, Colored Pass/Fail Test
Compliant to Norm	ISO 11146 (Beam Widths, Divergence Angle and Beam Propagation Factor)
General System Requirements	Windows 2000/XP/Vista or later, USB2.0 port recommended, 120 MB HD, 512 MB RAM
M Analysis System
Compatible M Options	BP1M2-xx Series, M2SET-xxx Series
Compliant to Norm	ISO 11146
Measured Parameters**	M , Waist Width, Waist Position, Rayleigh Length, Divergence, Beam Pointing, Waist Asymmetry, Astigmatism